The SMCF is defined in three areas (bays): scanning probe microscopy, thermal and optical analysis, and mechanical characterization and sample preparation. The scanning probe microscopy (SPM) bay contains four SPM microscopies, including Attocube SPM, Bruker Icon SPM, EnviroScope Atomic Force Microscope, and Dimension 3100 SPM. The SPM offers simultaneous high-magnification observation of 3D images and related physical properties and measurements in various environments.
Two thermal analysis systems, a differential scanning calorimeter (DSC 204 F1 Phoenix) and a thermogravimetry analysis system (TGA 209 F1 Libra), allow users to study and measure various thermal properties of materials, such as glass transition, melting, and crystallization temperatures. Also available is an Olympus BX51 polarizing optical microscope, which includes a Mettler Toledo FP900 thermal system equipped with an FP 82 hot stage with a temperature range from room temperature to 375° C.
The mechanical characterization and sample preparation bay houses the following: (1) Tukon 2500 Knoop/Vickers Hardness tester, (2) BUEHLER ISOMet 1000 Precision Saw, (3) BUEHLER MiniMet 1000 Grinder-polisher, and (4) Sartorius Cubis MSU2.7S-000-DM Microbalance.