A state-of-the-art multifunctional, low-temperature, high-magnetic field scanning probe microscopy (LTHM-SPM) system is available for nanoscience and engineering research.
This LTHM-SPM is capable of characterizing spatially resolved conductivity (c-AFM), magnetic force (MFM), piezoresponse (PFM), and topography (AFM) down to the nanoscale.
The LTHM-SPM system's unique capabilities include imaging various physical properties over a wide temperature range (4 -300 K) and magnetic field range (0-9 T). It is a powerful tool for materials investigations.